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170612s2020 enk o 000 0 eng |
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|aGBB7B5448|2bnb
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020 |
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|a9780081010891 (electronic bk.)
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020 |
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|a9781785481543 (hbk.)
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|aStDuBDS|beng|cStDuBDS|dUk
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041 |
0
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|aeng
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050 |
4
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|aTK7871.86
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082 |
04
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|a621.381522|223
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100 |
1
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|aVanzi, Massimo.
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245 |
10
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|aAdvanced laser diode reliability|h[electronic resource] /|cMassimo Vanzi, Laurent Béchou, Mitsuo Fukuda, Giovanna Mura.
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260 |
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|aLondon, UK :|bISTE Press ;|aOxford, UK - Elsevier,|c2020.
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300 |
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|a1 online resource.
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0
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|a1. Laser Diode Reliability 2. Multi-Component Model for Semiconductor Laser Degradation 3. Reliability of Laser Diodes for High-Rate Optical Communications - A Monte Carlo-Based Method to Predict Lifetime Distributions and Failure Rates in Operating Conditions 4. Laser Diode Characteristics 5. Laser Diode DC Measurement Protocols.
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650 |
0
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|aDiodes, Semiconductor|xReliability.
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655 |
4
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|aElectronic books.
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700 |
1
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|aBéchou, Laurent.
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700 |
1
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|aFukuda, Mitsuo.
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700 |
1
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|aMura, Giovanna.
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856 |
40
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|uhttps://www.sciencedirect.com/science/book/9781785481543
|