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180108s2018 nju ob 001 0 eng |
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|a 2018000679
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|a9781119289654|q(electronic bk. ;|qoBook)
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|a1119289653|q(electronic bk. ;|qoBook)
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|a9781119289678|q(pdf)
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|a111928967X|q(pdf)
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|a9781119289661|q(epub)
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|a1119289661|q(epub)
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|z9781119289647|q(cloth)
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|aDLC|beng|cDLC|dOCLCO|dOCLCF|dOCLCQ|dDG1|dMERER|dUIU|dUAB|dUPM
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050 |
10
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|aTK5103.2
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082 |
00
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|a621.39/5|223
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100 |
1
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|aHwang, Lih-Tyng.
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10
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|a3D IC and RF SiPs|h[electronic resource] :|badvanced stacking and planar solutions for 5G mobility /|cLih-Tyng Hwang, Tzyy-Sheng Jason Horng.
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|a1st ed.
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|aHoboken, NJ :|bJohn Wiley & Sons :|bIEEE,|c2018.
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300 |
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|a1 online resource.
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504 |
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|aIncludes bibliographical references and index.
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0
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|aFront Matter -- MM and MTM for Mobility -- Interconnects -- State-of-the-Art IC Packages, Modules, and Substrates -- Passives Technology -- Electrical Design for 5G Hardware-Digital Focus -- Electrical Design for 5G Hardware-RF Focus -- Product, Process Development, and Control -- Product Life and Reliability Assessment -- Hardware Solutions for 5G Mobility -- Appendices. A. Failure Mechanisms and Failure Analysis -- B. ANOVA -- C. Gauge R&R and DOE -- D. Statistics Tables -- Index
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588 |
0
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|aPrint version record and CIP data provided by publisher; resource not viewed.
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650 |
0
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|aMobile communication systems|xTechnological innovations.
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700 |
1
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|aHorng, Tzyy-sheng Jason.
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856 |
40
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|uhttps://onlinelibrary.wiley.com/doi/book/10.1002/9781119289654
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