008 |
|
130610s2010 njua ob 001 0 eng d |
020 |
|
|a9780470606834 (electronic bk.)
|
020 |
|
|a0470606835 (electronic bk.)
|
020 |
|
|a9780470606827 (electronic bk.)
|
020 |
|
|a0470606827 (electronic bk.)
|
020 |
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|z9780470597200 (pbk.)
|
020 |
|
|z0470597208 (pbk.)
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050 |
4
|
|aQA76.76.S65|bA27 2010
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082 |
04
|
|a005.14|222
|
100 |
1
|
|aAbran, Alain,|d1949-
|
245 |
10
|
|aSoftware metrics and software metrology|h[electronic resource] /|cAlain Abran.
|
260 |
|
|aHoboken, N.J. :|bWiley ;|aLos Alamitos, CA :|bIEEE Computer Society,|cc2010.
|
300 |
|
|a1 online resource (xix, 328 p.) :|bill.
|
504 |
|
|aIncludes bibliographical references and index.
|
588 |
|
|aDescription based on print version record.
|
650 |
0
|
|aSoftware measurement|xDesign.
|
650 |
0
|
|aSoftware measurement|xDesign|vCase studies.
|
856 |
40
|
|uhttp://onlinelibrary.wiley.com/book/10.1002/9780470606834
|