臺北市立大學圖書館

首頁 > 書目資料

借閱次數 :

Atomic force microscopy in process engineering [electronic resource] : introduction to AFM for improved processes and products /

點閱：1426
評分：0
評論：0
引用：0
轉寄：0

簡略

詳細

MARC

001

223647

003

OCoLC

005

20100729101520.0

006

m d

007

cr cnu---unuuu

008		090810s2009 enka ob 001 0 eng d
040		\|aOPELS\|beng\|cOPELS\|dN$T\|dOPELS\|dOCLCQ
020		\|a9780080949574 (electronic bk.)
020		\|a0080949576 (electronic bk.)
035		\|a(OCoLC)429897934
050	4	\|aQH212.A78\|bB69 2009eb
082	04	\|a620/.5\|222
049		\|aTEFA
245	00	\|aAtomic force microscopy in process engineering\|h[electronic resource] :\|bintroduction to AFM for improved processes and products /\|c[edited by] W. Richard Bowen and Nidal Hilal.
250		\|a1st ed.
260		\|aOxford ;\|aBurlington, MA :\|bElsevier/Butterworth-Heinemann,\|c2009.
300		\|a1 online resource (xvi, 283 p.) :\|bill.
520		\|aAtomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments and is therefore a critical tool for process engineers and scientists, where AFM investigations are leading directly to improved processes and products. This is the first book to bring together both the basic theory and proven process engineering practice of AFM, and to present them in a way that is accessible and valuable to both practising engineers, those who are improving their AFM skills and knowledge, and to researchers who are developing new products and solutions using AFM. The book takes a rigorous but practical approach to ensure that it is also directly applicable to practical process engineering problems. Fundamentals of the techniques are concisely described and specific benefits for process engineering clearly defined and illustrated. Coverage of applications of AFM to important areas of process engineering is comprehensive. Each of the chapter authors are recognized authorities on their subject.
505	0	\|aBASIC PRINCIPLES OF ATOMIC FORCE MICROSCOPY / W Richard Bowen, Nidal Hilal and Daniel Johnson -- CHARACTERISATION OF MEMBRANE SURFACES / W Richard Bowen, Nidal Hilal and Teodora Doneva -- AFM AND DEVELOPMENT OF (BIO)FOULING RESISTANT MEMBRANES / W Richard Bowen, Nidal Hilal, Huabing Yin and Laila Al-Khatib -- APPLICATION OF ATOMIC FORCE MICROSCOPY TO PARTICLE-PARTICLE INTERACTIONS / Nidal Hilal, Yuncheng Liang and Daniel Johnson -- QUANTIFICATION OF PARTICLE-BUBBLE INTERACTIONS / Nidal Hilal and Daniel Johnson -- NANOSCALE ANALYSIS OF PHARMACEUTICALS BY SCANNING PROBE MICROSCOPY / Clive J Roberts -- THE APPLICATION OF AFM WITHIN BIOPROCESS ENGINEERING / Chris J Wright -- THE APPLICATION OF AFM TO THE DEVELOPMENT OF PROCESS PLANT MATERIALS / Chris J Wright -- ATOMIC FORCE MICROSCOPY AND POLYMERS ON SURFACES / Vasileios Koutsos -- AFM-BASED MICRO/NANO-RHEOMETRY / Matthew S Barrow and P Rhodri Williams -- CONCLUSIONS AND FUTURE OUTLOOK / W Richard Bowen and Nidal Hilal.
504		\|aIncludes bibliographical references and index.
500		\|aDescription based on print version record.
650	0	\|aAtomic force microscopy.
650	0	\|aProduction engineering.
655	7	\|aElectronic books.\|2local
700	1	\|aBowen, W. Richard.
700	1	\|aHilal, Nidal.
776	08	\|iPrint version:\|aBowen, W. Richard.\|tAtomic force microscopy in process engineering.\|dOxford ; Burlington, MA : Butterworth-Heinemann, 2009\|z9781856175173\|w(OCoLC)311788904
856	40	\|uhttp://www.sciencedirect.com/science/book/9781856175173
856	40	\|3NetLibrary\|uhttp://www.netlibrary.com/urlapi.asp?action=summary&v=1&bookid=249345
856	40	\|3Referex\|uhttp://www.engineeringvillage.com/controller/servlet/OpenURL?genre=book&isbn=9781856175173\|zAn electronic book accessible through the World Wide Web; click for information
994		\|aC0\|bTEF

書籤：

人氣指樹

匯出資料

調閱

館藏
簡介
作者簡介
標籤(0)
收藏(0)
評論(0)
評分(0)
引用(0)

This is the first book to bring together both the basic theory and proven process engineering practice of AFM, and to present them in a way that is accessible and valuable to both practising engineers, those who are improving their AFM ...

回頁首

此功能為會員專屬功能請先登入

本文的引用網址:

Atomic force microscopy in process engineering [electronic resource] : introduction to AFM for improved processes and products /

書架附近的資料 :