借閱次數: 0
|
System-on-chip test architectures nanometer design for testability /
- 作者:edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba
- 出版者:Morgan Kaufmann Publishers
- 出版地:Amsterdam ; Boston :
- 語文:英語
- 叢書名:The Morgan Kaufmann series in systems on silicon
|