Structural, syntactic, and statistical pattern recognition Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17-19, 2018 : proceedings /

• 作者：edited by Xiao Bai ... [et al.].
• 出版者：Springer International Publishing : Imprint: Springer
• 出版地：Cham :
• 語文：英語
• 叢書名：Lecture notes in computer science, ; Image processing, computer vision, pattern recognition, and graphics
• 電子資源：https://doi.org/10.1007/978-3-319-97785-0
• ISBN/ISSN/ISRC：9783319977850 ; 9783319977843
• 作者：Bai, Xiao.
• 索書號：006.3