Chi-squared goodness of fit tests with applications

• 作者：V. Voinov, KIMEP University; Institute for Mathematics and Mathematical Modeling of the Ministry of Education and Science, Almaty, Kazakhstan, M. Nikulin, University Bordeaux-2, Bordeaux, France, N. Balakrishnan, McMaster University, Hamilton, Ontario, Canada.
• 出版者：Elsevier/AP
• 出版地：Amsterdam :
• 語文：英語
• 電子資源：http://www.sciencedirect.com/science/book/9780123971944
• ISBN/ISSN/ISRC：9780123971944 (electronic bk.) ; 9780123971944
• 作者：Voinov, Vassiliy.;Balakrishnan, N.;Nikulin, M. S.
• 索書號：519.5/6