VLSI test principles and architectures design for testability /

• 作者：edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.
• 出版者：Elsevier Morgan Kaufmann Publishers
• 出版地：Amsterdam ; Boston :
• 語文：英語
• 叢書名：The Morgan Kaufmann series in systems on silicon