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061020s2005 pg a b 001 0 eng d |
020 |
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|a352740502X
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035 |
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|a00241457
|
040 |
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|aTMUE|beng|cTMUE|dTMUE
|
050 |
14
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|aTA418.9.N35|bN39 2005
|
082 |
04
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|a620.50287|222
|
245 |
00
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|aNanoscale calibration standards and methods : |bdimensional and related measurements in the micro- and nanometer range / |cedited by Gnter Wilkening, Ludger Koenders
|
260 |
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|aWeinheim : |bWiley-VCH, |cc2005
|
300 |
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|axxii, 519 p : |bill ; |c25 cm
|
500 |
|
|aConference proceedings
|
504 |
|
|aIncludes bibliographical references and index
|
650 |
0
|
|aNanostructured materials|xMeasurement
|
650 |
0
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|aMicrostructure|xMeasurement
|
650 |
0
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|aScientific apparatus and instruments|xCalibration
|
650 |
0
|
|aStereology
|
700 |
1
|
|aWilkening Gnter
|
700 |
1
|
|aKoenders Ludger
|