008 |
|
920729s19uu ch 000 0 chi d |
020 |
|
|a0716781794 : |cNT$652
|
040 |
|
|aTMUE|beng|cTMUE|dTMUE|eCCR
|
084 |
|
|a621.3815|bA161|2ncsclt
|
100 |
1
|
|aAbramoviciMiron
|
245 |
10
|
|aDigital systems testing and testable design / |cMiron Abramovici ; Melvin A. Breuer, Arthur D. Friedman
|
260 |
|
|aNew York : |bComputer Science Press, |cc1990
|
300 |
|
|axxi, 653 p : |bill ; |c24 cm
|
504 |
|
|aIndex: p. 647-653
|
541 |
|
|aNT$652
|
650 |
0
|
|aDigital integrated circuits|xTesting
|
700 |
1
|
|aBreuer Melvin A
|
700 |
1
|
|aFriedman Arthur D
|