008 |
|
780928s1978 ng af b 101 0 eng d |
015 |
|
|a78022081 //r89
|
020 |
|
|a0444851305
|
035 |
|
|a78022081
|
040 |
|
|aTMUE|beng|cTMUE|dTMUE
|
050 |
14
|
|aTA417.23|bD54 1978
|
082 |
04
|
|a620.1/127
|
090 |
|
|a01|b|p|tDDC|d620.1127|eD569|cA0071629|lv.1|r0.0
|
245 |
00
|
|aDiffraction and imaging techniques in material science / |ceditors, S. Amelinckx, R. Gevers, J. Van Landuyt
|
250 |
|
|a2nd revised ed
|
260 |
|
|aAmsterdam ; |aNew York : |bNorth-Holland Pub. Co : |bsole distributors for the U.S.A. and Canada, Elsevier North-Holland, |c1978
|
300 |
|
|a2 v. (xvii, 847 p., [1] fold. leaf of plates) : |bill ; |c23 cm
|
500 |
|
|aComprises new contributions and revised and updated papers originally presented at the International Summer Course on Material Science, Antwerp, 1969, and published in 1970 under title: Modern diffraction and imaging techniques in material science
|
504 |
|
|aINCLSBRINX
|
505 |
1
|
|av. 1. Electron microscopy--v. 2. Imaging and diffraction techniques
|
650 |
0
|
|aElectron microscopy|xCongresses
|
650 |
0
|
|aElectrons|xDiffraction|xCongresses
|
650 |
0
|
|aImaging systems|xCongresses
|
700 |
1
|
|aAmelinckx S|q((Severin)
|
700 |
1
|
|aGevers R
|
700 |
1
|
|aLanduyt J. van
|
710 |
2
|
|aInternational Summer Course on Material Science|d1969|cAntwerp, Belgium)
|