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|
800709s1980 xxka b 101 0 eng d |
015 |
|
|aGB***
|
020 |
|
|a0854981438 (pbk) : |c00
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035 |
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|aNF000040887
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040 |
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14
|
|aQH212.E4|bE379
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082 |
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|
|a502/.8/25|219
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084 |
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|a305.42|bF329|2ncsclt
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090 |
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|a01|b|p|tDDC|d305.42|eF329|cA0144328|y1980|r0.0
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090 |
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090 |
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|a01|b|p|tDDC|d305.42|eF329|cA0147171|y1980|r46.0
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090 |
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|a01|b|p|tDDC|d305.42|eF329|cA0149317|y1980|r828.0
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100 |
1
|
|aMulveyT
|
245 |
10
|
|aElectron microscopy and analysis, 1979 : |bproceedings of the Institute of Physics Electron Microscopy and Analysis Group conference held atthe University of Sussex, Brighton, 3-6 September 1979 (EMAG 79) / |cedited by T. Mulvey
|
260 |
|
|aBristol : |bInstitute of Physics, |c1980
|
300 |
|
|axv, 472 p : |bill ; |c24 cm
|
490 |
1
|
|aConference series - Institute of Physics ; no. 52
|
504 |
|
|aIncludes bibliographical references and indexes
|
650 |
0
|
|aElectron microscopy|xCongresses
|
650 |
0
|
|aMicroprobe analysis|xCongresses
|
710 |
2
|
|aInstitute of Physics (Great Britain)|bElectron Microscopy and Analysis Group
|
830 |
0
|
|aConference series - Institute of Physics ; no. 52
|